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The Center for the Joint Use of Unique Scientific Equipment (Center), under the auspices of the Institute of Ion-Plasma and Laser Technologies of the Academy of Sciences of the Republic of Uzbekistan named after U.A. Arifov, has been established in accordance with Decision of the Presidium of the Academy of Sciences of the Republic of Uzbekistan No. ПМК-6/1 of February 21, 2020, the Law of the Republic of Uzbekistan “On Science and Scientific Activities” No. 576 of October 29, 2019 and the Decree of the President of the Republic of Uzbekistan No. PK-3365 of November 1, 2017, authorizing the Academy of Sciences of the Republic of Uzbekistan to create the Center for the joint use of scientific equipment.
The creation of the Center contributed to improving the efficiency of unique foreign scientific equipment through its centralized use, providing access to unique and valuable foreign scientific equipment for all subjects of scientific research, saving budget funds by reducing the cost for purchase of the same expensive equipment by individual organizations.
The main activities of the Center
- organizing and conducting research on plans and projects of cooperation within the Academy of Sciences of the Republic of Uzbekistan, as well as cooperation with universities and other concerned organizations;
- collection of experimental data within the framework of state and international programs, agreements and composition determination, presentation of results on the composition and other properties of substances on the basis of experimental data collected at the customer’ request;
- participation in the implementation of tasks within the framework of state scientific and technical programs, international and innovative projects:
- implementation of research, development and technological work, improvement of available methods for testing and analysis and development of new ones, creation of new types of measuring instruments.
Along with providing all the current needs of the Institute of Ion-Plasma and Laser Technologies of the Academy of Sciences of the Republic of Uzbekistan, in terms of conducting analytical research in the implementation of both fundamental and applied programs and projects, the Center successfully cooperates with NPO “Physics of the Sun” of the Academy of Sciences of the Republic of Uzbekistan, the Institute of Nuclear Physics of the Academy of Sciences of the Republic of Uzbekistan, Institute of Polymer Chemistry and Physics of the Academy of Sciences of the Republic of Uzbekistan, Institute of Material Science of the Academy of Sciences of the Republic of Uzbekistan, Research Institute of Physics of Semiconductors and Microelectronics, Scientific and Technical Center with Design Bureau and OP of the Academy of Sciences of the Republic of Uzbekistan, National University of Uzbekistan, Tashkent State Technical University, Termez State University, Chirchik State Pedagogical University, FE LLC “EUROPAINT” and other organizations interested in studying various objects with unique scientific equipment of the Center.
The Center equipment park includes modern, unique, high-tech analytical instruments capable of successfully solving a whole range of research problems.
Gas chromatography
is a method for chromatographic separation and analysis of substance mixtures.
The operation principle of gas chromatographs is as follows: through the injection system, a liquid sample is introduced into the chromatographic column, through which a carrier gas (argon, helium, nitrogen, etc.) is continuously fed at a constant or variable rate. The chromatograph column is filled with a sorbent and placed in a thermostat that allows the temperature to be maintained from –99°С to 500°С. In the chromatographic column an initial multicomponent mixture is separated. Depending on the sorbability of the components, binary mixtures (carrier gas and sample component) enter the detector in a certain order, in which the change in the concentration of the outgoing components is recorded.
In the Center: the gas chromatography method is presented by the GC 7890A Series gas chromatograph from Agilent Technologies.
The GC 7890A Series is designed for the qualitative and quantitative analysis of volatile organic compounds in a variety of objects by chromatographic methods.
The GC 7890A Series uses a Flame Ionization Detector (FID) and a Catharometer (TCD) as detectors. The GC 7890A Series provides a minimum detectable level of <5 pkg (5 * 10-12 g).
The method of chromato-mass spectrometry
is based on a combination of two independent methods - chromatography and mass spectrometry.
With the help of the first one, a mixture is separated into components, with the help of the second, the identification and determination of the structure of the substance and its quantitative analysis are performed.
In the Center: the method of gas chromatography-mass spectrometry is presented by the GC-mass spectrometer MSD 5975C-GC 7890A from Agilent Technologies.
The tandem of two analytical instruments (a chromatograph and a quadrupole mass spectrometer as a detector) makes it possible to obtain not only the chromatogram of a product under study, but also the mass spectra of all substances included in its composition, which with the use of an extensive library database makes it possible to identify all substances included in the product.
The MSD is intended for analysis of mixtures of mainly organic substances and for determination of trace amounts of substances in a liquid volume.
The high technical characteristics of MSD are as follows:
- Mass range: 1.6 - 550 amu;
- Mass stability: Better than 0.1 amu. after 72 hours of operation
- Sensitivity for electron impact ionization, scan mode: 1 picogram (10-12g.)
- Electron impact ionization sensitivity, single ion detection mode: 20 femtograms (10-15g.)
| Full time chromatogram ion current of the tetraethoxysilane sample | Mass spectrum of tetraethoxysilane corresponding to the chromatogram |
Inductively coupled plasma optical emission spectrometry
(ICP-OES, ICP-OES)
is a method for measuring the radiation emitted by elements in a sample placed in an inductively coupled plasma.
The measured emission intensity values are then compared with the intensity values of the known concentration standards in order to obtain the concentration value of the element in the unknown sample.
In the Center: the method of optical emission spectrometry with inductively coupled plasma is presented by an Agilent spectrometer ICP-OES Spectrometer 710 Series, the best choice for routine testing
The Agilent 710 Series ICP spectrometer is designed for the simultaneous precision rapid determination of up to 73 elements of the periodic table in liquid and solid samples (in solid samples after dissolution).
ICP-OES has an optical range of 175 - 785 nm, providing full coverage of all spectral lines in it, with a typical range of determined concentrations from tenths of ppb (10-8%) to tens of percent, a linear range of a single determination of up to 5 orders of magnitude and a pixel resolution - 0.8 pm.
Infrared (IR) spectroscopy
is one of the non-destructive analytical methods for studying various materials.
This method is used in solid state physics, physical chemistry, organic and inorganic chemistry, biochemistry, etc. It is used to identify unknown materials, determine functional groups in organic and inorganic substances, quantify components in various mixtures, and decipher the structure of crystals.
In the Center: the method of infrared spectroscopy is presented IR Fourier spectrometer of Agilent Technologies Cary 640 Series FTIR Spectrometer
The advantages of the Fourier spectrometer, in contrast to spectrometers with diffraction gratings, prisms as dispersive elements, are:
- high signal-to-noise ratio,
- ability to work within a wide range of wavelengths without changing the dispersing element,
- quick registration of the spectrum,
- high resolution.
The Fourier spectrometer, using the PIKE Technologies MIRacle ATR and PIKE Technologies VeeMAX II attachments, allows you to measure the IR reflection and transmission spectra of various solid-state samples (semiconductors, polymers, biomaterials, metals, ceramics, etc.), liquids and gases.
Specifications:
- Interferometer type: High-aperture 38 mm dynamically adjusted 60-degree Michelson interferometer, includes a new adjustable filament source to deliver the optimal amount of energy to the sample
- Spectral range Mid IR range 7800-375cm-1
- Spectral resolution <0.18 cm-1
- Signal-to-noise ratio 6,000:1 (absorbance=7.2 x 10-5) peak-to-peak measurement in standard configuration with 4 cm-1 spectral resolution, 5 sec integration time)
- Beam splitters Optimized KBr
- He-Ne laser, c wavelength 632.8nm.
- Source Ceramic
- Detector Cooled DLaTGS (from deuterated triglycerol sulfate with Peltier cooling)
- Monochromator : High Speed Czerny-Turner
- Built-in test and standards to verify the operation of the device
- Outputs of an external beam for connection of remote attachments
IR spectrum of a sample containing 31.6% tetraethoxysilane
IR spectrum of a sample containing 8.54% tetraethoxysilane
Family of IR spectra of samples of 8.54% tetraethoxysilane (1) and 31.6% tetraethoxysilane (2)
The method of Raman spectroscopy (Raman spectroscopy)
is based on the interaction of light with matter
It provides insight into the structure of a material or its characteristics, and is similar to Fourier IR spectroscopy (FTIR) in this respect. Raman spectroscopy is based on the study of scattered light, while IR spectroscopy is based on the absorption of light. Raman spectroscopy provides information about intramolecular and intermolecular vibrations and helps to get a better idea of the reaction. Both Raman and IR-Fourier spectroscopy give a spectral characterization of the vibrations of molecules ("molecular imprint") and are used to identify substances. At the same time, Raman spectroscopy can provide additional information about low-frequency modes and vibrations, which indicate the features of the crystal lattice and molecular structure.
In the Center: Raman spectroscopy represents InViaRaman spectrometer manufactured by “Renishaw”, UK
The InViaRaman spectrometer is intended for both fundamental research and structural studies of the routine nature of liquid, solid and powdery objects, including obtaining fingerprints of molecules, as well as monitoring changes in the structure of molecular bonds (for example, changes in state and stress and deformation)
Main Applications of Raman Spectroscopy Raman spectroscopy is used in industry for a variety of applications, including:
- Study of crystallization processes
- Identification of polymorphic forms
- Study of polymerization reactions
- Study of hydrogenation reactions
- Chemical synthesis
- Biocatalysis and enzymatic catalysis
- Chemical processes in the stream
- Monitoring of biological processes
- Study of synthesis reactions
Raman spectrum of a sample containing 8.54% tetraethoxysilane
Raman spectrum of a sample containing 31.6% tetraethoxysilane
Raman spectrum of a sample containing 8.54% tetraethoxysilane, with the results of the spectrum integration procedure over the spectral range 350-1100 cm-1
Raman spectrum of a sample containing 31.6% tetraethoxysilane, with the results of the spectrum integration procedure over the spectral range 350-1100 cm-1
Ellipsometry
is a fast, highly sensitive and accurate optical method for determining the thicknesses of optically (within the DUV-MidIR range) transparent films and their optical constants.
The method is based on measuring a change in polarization of light when it interacts with a reflective surface, layered structures, or when passing through various media.
In the Center: the ellipsometry method is presented spectral ellipsometer SER 850 SENresearch 4.0 manufactured by SENTECH Instruments GmbH (Germany) with the wavelength range: DUV-VIS-NIR
The SER 850 SENresearch 4.0 is specially designed for research with the ability to measure thicknesses of single and multilayer films and film structures at various angles and for measuring the optical characteristics of film structures (refractive index, absorption index) on various types of surfaces in the UV and visible and IR ranges from 240 to 2500 nm, while providing measurement of film thicknesses from 1 Å to 200 μm (ultra-thin films).
Autofocus and Sample Stage Angle Screen
The result of the study in SE-Recipe mode dielectric film with a thickness of 353.6 nm (the accuracy of determining the film thickness is up to 1 Å in the range of 240-2500 nm.), on the surface of a silicon substrate. The value of the refractive index n=1.462.
Atomic force microscopy
is a type of scanning probe microscopy based on van der Waals interactions between a probe and a sample surface.
The atomic force microscope (AFM) uses the forces of atomic bonds acting between the atoms of a substance and manifesting itself at small distances between two atoms as repulsive forces, and at large distances as attractive forces.
Using the fact that similar forces also act between any approaching bodies, in a scanning atomic force microscope, the surface under study and the tip sliding over it are used as such bodies.
In the Center: atomic force microscopy is presented by the scanning probe microscope SOLVER NEXT (NT-MDT)
SOLVER NEXT is a multifunctional scanning probe microscope of wide application, which allows obtaining an image of the topography and topography of the surface of the investigated object. The resolution of SOLVER NEXT, depending on the used measurement method, is provided within the range of 0.1-5nm.
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| AFM image of the surface nanosilicon | Nanoprofilometry of the nc-Si surface | Cross section line nc-Si surface area |
Transmission electron microscope LEO 912 (ZEISS, Germany)
LEO 912 AB (ZEISS, Germany) (resolution 0.2 nm, magnification 50-500000) For sample preparation - "Disc Cutter" device, for grinding samples - "Dimpling Grinder", including VitRobot devices for high-speed freezing of liquid and biological samples.
This microscope makes it possible to obtain high-contrast high-quality images of nanostructures and biological objects, to study the structure of various substances, including amorphous and crystalline materials. The design of the microscope, in the presence of special software, allows simultaneously with obtaining a high-quality image to carry out elemental microanalysis of the objects under study. The microscope is equipped with a CCD camera, a special image processing program.